Abstract
We analyse properties of photon migration in reflectance measurements made on a semi-infinite medium bounded by a plane, in which optical parameters may vary in directions neither parallel to, nor perpendicular to the bounding plane. Our aim in doing this is to develop the formulae necessary to deduce parameters of directionality from both time-gated and continuous wave measurements. The mathematical development is based on a diffusion picture, in which the bounding plane is regarded as being totally absorbing so that all photons reaching the surface contribute to the reflectance.
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