Photon-induced post-collisional Auger decay: a modified 'shake-down' model

Abstract

A modified 'shake-down' model describing both Auger and photoelectron lineshapes is derived from the two-potential formulation of post-collision interaction following photon impact. The model gives the correct expression for the lineshapes at high photoelectron energies and finite Auger energies. The distortion of the lineshapes is shown to be given by the overlap between the photoelectron wavefunctions in the final and smeared intermediate states, for which a construction is explicitly given.