Abstract
To determine the exciton diffusion length of sexithiophene (6T) thin films, quenching of the photoluminescence (PL) of vacuum-deposited 6T films on TiO2 and on quartz has been investigated. For films with a thickness of more than 22 nm and at temperatures below 100 K, additional PL lines appear in luminescence spectra. This feature is related to the structural properties of 6T films. The PL intensity is thermally activated with an activation energy of 18 meV on TiO2 and 6 meV on quartz. When 6T is applied on TiO2, exciton quenching occurs for films up to 120 nm. For 6T on quartz this value is reduced to 60 nm. By comparing the relative luminescence intensities of 6T on quartz and on TiO2 substrates, an exciton diffusion length of 60 +/- 5 nm is derived.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
