Photoluminescence Study of As Doped p-type HgCdTe Absorber for Infrared Detectors Operating in the Range up to 8 µm

Abstract

A HgCdTe photodiode grown by chemical vapor deposition (MOCVD) on a GaAs substrate operating in the long-wave infrared (LWIR) range was characterized using photoluminescence (PL) measurements. At high temperatures, the PL spectrum originates from a free-carrier emission and might be fitted by a theoretical expression being the product of the density of states and the Fermi–Dirac distribution. At low temperatures, the PL spectrum consists of multiple emission peaks that do not originate solely from the energy gap. Such spectra are not unambiguous to interpret due to the prominence of different optical transitions. Spectral response (SR) measurements were used to determine the energy gap (Eg) and extract the band-to-band transition from the PL spectra. PL peaks visible within the band gap were fitted by a Gaussian distribution. To identify the sources of individual emission peaks, excitation power dependence analysis was conducted. Band-to-band, free-to-bound, acceptor-bound exciton, and defect-bound exciton transitions were identified. At low temperatures, transitions are mainly impurity-related, with shallow impurity levels estimated to be 6 meV and 16 meV for the donor and acceptor, respectively, while deep-level impurities were associated with VHg. The latter transition with an energy of about 78 meV does not vary with temperature. Its relative positions with respect to the energy gap is 0.8 Eg at 18 K and 0.67 Eg at 80 K.