Abstract
Photoluminescent SrAl 2O 4:Eu,Dy thin films were successfully prepared by a pulsed ion-beam evaporation method without substrate heating or sample annealing. The crystallinity of the films was observed by X-ray diffraction and large-area high-resolution electron microscopy. From the above results and photoluminescence spectra (PL), it was concluded that the intensity at the peak in PL spectra is related to the volume fraction of a crystallized SrAl 2O 4:Eu,Dy phase in the thin films.
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