Abstract
We report here on the efficient use of hydrogenation as a tool to investigate the intrinsic properties of non-radiative recombination channels in a low-pressure metal-organic vapor phase epitaxy grown quantum dots (QDs) array emitting around 1.3 μm. It is shown that hydrogenation reduces by a factor of two the flow of charge carriers to non-radiative channels in QDs related to the presence of impurities and further suppresses completely the non-radiative recombinations originating from the stacking faults and dangling bonds. Most importantly, hydrogenation improves the room temperature photoluminescence intensity of the ≈1.3 μm emitting In(Ga)As/GaAs QDs by a factor close to ten.
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