Abstract
AbstractIn this paper, the structural and optical properties of MgxZn1–xO films are studied. The MgxZn1–xO films were deposited by metal‐organic chemical vapor deposition (MOCVD). The concentration of Mg in the sample was changed in the range from x = 0 to 0.5. The structure of the films was characterized by X‐ray diffraction (XRD) and atom force microscope (AFM). The optical band gap of the films was measured by UV‐Vis spectrophotometer and photoluminescence (PL) spectra. The exciton recombination dynamics was also investigated with time‐resolved photoluminescence (TRPL) at 77 K. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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