Abstract
The effects of mechanical polishing on the photoluminescence (PL) from each polar face of wurtzite-structure ZnO are presented. Differences observed for the 4.2K PL of a mechanically polished surface when compared to that of a chemomechanically polished surface include broadened bound-exciton peaks, hot-exciton luminescence, and a donor-acceptor pair peak at 3.2108eV. Analysis of this donor-acceptor pair peak results in estimated donor and acceptor ionization energies of 52±10 and 230±10meV, respectively, with a mean separation distance between pairs of approximately 3–4nm. The donors and acceptors are attributed to point defects introduced by dislocation motion during the polishing process and identified as octahedral Zn interstitials and Zn vacancies, respectively.
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