Abstract
Polysiloxanes and polycarbosilanes films were irradiated with increasing fluences of C or Au ions and changes of their photoluminescence (PL) spectra were correlated to structural transformations, assessed by means of ion beam analyses, Raman, XPS and FTIR. They exhibit a strong yellow emission when the energy transferred by the ions to electron shells of target atoms is within the range of 20–60 eV/atom, due to the segregation of C into clusters embedded in an amorphous Si xO yC yH z matrix. For larger energy transfers and for pyrolized films, the photoluminescence shifts towards red then vanishes, because of the growth and percolation of the quantum dots.
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