Abstract
The photoluminescence (PL) of ZnO thin films grown by magnetron sputtering at room temperature has been observed. The PL spectra were measured using an instrument from Accent Optical Technologies with a solid state UV laser (λ = 266 nm) as the pumping source and at the temperature of 300 K. Samples grown at sputtering power of 100-200 W show a strong photoluminescence (PL) at wavelength of 377 nm and its intensity shows non-linear dependence with magnetron power. At values of sputtering power less then 100 W PL signal was not observed. A correlation between PL, XRD intensity and ZnO grain size was shown.
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