Abstract
We have fabricated Si nanoparticles from Si swarf using the beads milling method. The mode diameter of produced Si nanoparticles was between 4.8 and 5.2 nm. Si nanoparticles in hexane show photoluminescence (PL) spectra with peaks at 2.56, 2.73, 2.91, and 3.09 eV. The peaked PL spectra are attributed to the vibronic structure of adsorbed dimethylanthracene (DMA) impurity in hexane. The PL intensity of hexane with DMA increases by ~3000 times by adsorption on Si nanoparticles. The PL enhancement results from an increase in absorption probability of incident light by DMA caused by adsorption on the surface of Si nanoparticles.
Highlights
Si nanoparticles possess significant properties such as wide-bandgap energies due to the quantum confinement effect [1, 2], large surface area [3], and high reactivity [4]
We have developed a fabrication method of Si nanoparticles from Si swarf by use of the beads milling method [16, 17]
The widths of the X-ray diffraction (XRD) peaks for Si nanoparticles produced by the two-step milling method were larger than those for one-step milling, showing that the two-step milling effectively decreased the size of Si nanoparticles
Summary
Si nanoparticles possess significant properties such as wide-bandgap energies due to the quantum confinement effect [1, 2], large surface area [3], and high reactivity [4]. Extensive studies have been performed to produce Si nanoparticles using various methods including laser ablation [6, 7], plasma-enhanced chemical vapor deposition (CVD) [8], hot wire CVD [9], sputtering [10], Si implantation [11], intense pulsed ion beam evaporation [12], and co-evaporation of SiO plus SiO2 with subsequent heat treatment [13]. These methods require vacuum chambers and are time- and cost-consuming. We have developed a fabrication method of Si nanoparticles from Si swarf (i.e., industrial waste produced during slicing Si ingots) by use of the beads milling method [16, 17]
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
