Abstract
The local structure of samarium-doped titanium dioxide (TiO2:Sm) thin films fabricated by laser ablation and post annealing has been investigated by Sm L III-edge X-ray absorption fine structure (XAFS) analysis using a synchrotron radiation. The TiO2:Sm samples at annealing temperatures lower than 1000 °C showed an anatase (A-)TiO2:Sm crystal structure and transferred into a rutile (R-)TiO2:Sm phase at annealing temperature of 1100 °C. All the A-TiO2:Sm phase samples showed intense Sm-related photoluminescence (PL) at room temperature. It was shown that the samples which showed intense PL have shorter coordination distance for the first nearest neighbor of Sm than that of the samples which did not show PL after the crystal phase transition.
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