Abstract
The total photoion yields of xenon have been measured in the L-shell ionization region covering the photon energy from 4.6 to 6.1 keV with the step width of wavelength scans of about 0.0025 A. Monochromatized undulator radiation was used as a light source and crossed with an atomic xenon beam. Sharp peaks at the L 3 and L 2 edges, which had not been observed in previous work, are clearly seen in the present data. It can be suggested that these peaks are due to the photoexcitation of 2p electrons to the unfilled higher levels. Furthermore, a structure above the L 3 edge which suggests deviations from the power lawlike energy dependence predicted by an independent electron model can be seen in the present data. This structure might be due to simultaneous two-electron excitation.
Published Version
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