Abstract
Surface relief gratings formation in amorphous selenium thin films in two recording configurations with light intensity modulation were studied in situ by real-time atomic force microscopy and diffraction efficiency measurements. We report observation of mass transport effect in films induced by band-gap irradiation when the light polarization of the recording beams has a component along the light intensity gradient (“p-p” scheme of recording) that allows obtaining giant stable gratings in this versatile chalcogenide material. On the contrary, only a pure scalar weak grating caused by photoinduced volume shrinkage is obtained in the “s-s” recording configuration, even for long-term irradiation.
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