Abstract
The photoinduced charge-transfer process in PLZT ceramics is studied by measuring the refractive-index changes during hologram recording at λ=488 nm. From the measured values of the photoinduced space-charge fields, it is concluded that the photocarrier drift lengths are comparable with the fringe spacing (a few μm); the photorefractive sensitivity is limited by the low photoexcitation quantum efficiency (10−4) and is not influenced by oxidoreduction treatments.
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