Abstract

In order to observe the propagation of a conducting zone of a polyaniline film in response to anodic switching, propagation perpendicular to the film surface was simulated by propagation along the film by mounting the film on an insulated plate. A polyaniline film electrochemically deposited on an indium tin oxide (ITO) electrode was reinforced by casting polymethylmethacrylate solution on the film. It was peeled off the ITO, chemically reduced and then potentiostatically oxidized at one end in 1 mol dm −3 H 2SO 4 solution. Dynamic growth of the conducting zone was observed through an optical microscope. A well-defined boundary between the conducting zone and the insulating zone was seen. The contrast of the boundary did not vary with the electrolysis time, the growth length or the applied potential. The growth rate decreased slightly with the electrolysis time as a result of IR drop across the film. A differential equation for growth rate involving the effect of the IR drop was presented and solved to give more accurate values of the rate. The logarithmic growth ratio exhibited a linear relation with the applied potential, indicating a charge-transfer rate of the Tafel type. The anodic transfer coefficient was 0.2 and the rate constant was 5 × 10 −5 m s −1. The propagation on a molecular scale was discussed on the basis of the experimental results.

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