Abstract
AbstractX‐ray Photoelectron Spectroscopy was used to investigate Eu valence in the following EuF3 samples: single crystal, buried MBE layers (Au/EuF3/Fe/GaAs and Au/EuF3/Fe/Ag/GaAs) and amorphous thin films. Evidence was found for a surface divalent Eu state present on single crystal and amorphous films, while the MBE ultra thin buried layers only exhibited a trivalent Eu state. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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