Abstract
The electronic structures of various materials have been investigated using photoemission measurements. The sample charge-up problem, however, limits the application of these measurements to insulating materials. In this study, we propose a capacitive photocurrent detection method that permits photoelectron yield spectroscopy measurements of extremely insulating materials in both vacuum and ambient pressure conditions. The mechanism of detection is discussed, and the application to gold and rubrene films on mica substrates is demonstrated.
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