Photoelectron spectra of thulium atoms encapsulated C82 fullerene, Tm2@C82 (III) and Tm2C2@C82 (III)

Abstract

Ultraviolet photoelectron spectra (UPS) and X-ray photoelectron spectra (XPS) of two thulium atoms and thulium-carbide cluster entrapped fullerenes, Tm2@C82 (III) and Tm2C2@C82 (III), were measured using synchrotron radiation and MgKα X-ray light sources. The UPS spectral onset energy of these endohedral fullerenes is around 0.9eV, which is smaller than that of 1.2eV of empty C82. The UPS of Tm2@C82 (III) and Tm2C2@C82 (III) resemble each other. Further, the UPS of Tm2@C82 (III), Y2@C82-C3v and Er2@C82-C3v are almost identical and as well as are Tm2C2@C82 (III), Y2C2@C82-C3v and Er2C2@C82-C3v. The XPS Tm4d5/2 peaks of Tm2@C82 and Tm2C2@C82 appear at higher binding energy region than that of Tm@C82, which suggests the oxidation states of Tm atoms in Tm2@C82 (III) and Tm2C2@C82 are higher than that in Tm@C82.