Abstract
Real-time images produced by photoelectrons from metal and semiconductor samples have been generated using synchrotron radiation. A single electrostatic objective lens coupled to a two-stage image intensifier has been used to evaluate the feasibility of combined imaging and spectroscopy with photoelectrons in the ultraviolet and soft x-ray regions. Images were generated using photon energies ranging from 9 to 160 eV. The use of monochromatic synchrotron radiation provides a unique capability for generating image contrast by digital subtraction of images formed with photon energies above and below a core-level binding energy. A simple electron-optical objective lens produces images with a few microns resolution, and adequate sensitivity to image 45-eV kinetic energy electrons using bending magnet radiation. Calculations based on these experiments show that comparable resolutions are possible for combined microscopy and spectroscopy with electrons of order 100-eV kinetic energy using currently available bending magnet synchrotron radiation. Calculations for expected performance from undulator sources are presented.
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