Abstract
Structural parameters of the Si(001)(1×2)-Sb surface were optimized by photoelectron diffraction (PED) of Sb4d peaks. The optimized parameters are 3.17±0.1 Å for Sb-dimer bond length and 1.78±0.1 Å for the layer spacing between Sb and the first layer Si. The main origin of a surface-core-level-shifted (SCLS) component in Si2p core-level spectra is identified by SCLS-PED to be the first layer Si atoms connected to Sb dimers. Another SCLS component reported previously was not observed, which indicates that this SCLS component is related to some defects on the (1×2)-Sb surface.
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