Photoelectron diffraction azimuthal patterns from different atomic sites in the layer compound Sb 2Te 2Se

Abstract

We present azimuthal intensity plots of photoelectrons emitted from the Te 4d, Sb 4d, and Se 3d core levels of the layered compound Sb 2Te 2Se. This system allows us to separate and identify the emission from three different atomic sites well oriented with respect to the cleavage plane. The results demonstrate the structural sensitivity of diffraction of photoemitted electrons even three layers below the sample surface. The emission from the Te atoms at the cleavage plane is dominated by strong interlayer backscattering over an extended range of final state energies ( E f = 30 to 80 eV).