Abstract
Thin films of nanocrystalline Zn1−xRuxO are deposited on ITO substrate by sol–gel. XRD and EDX analysis indicated dominant evolution of wurtzite ZnO with crystallite size in the range 26–43 nm. With no evidence of phase segregation, Ru insertion in the host lattice is probably indicated by distortion in lattice parameters and concomitant rise in microstrain and dislocation density. SEM images indicated homogenous and continuous growth of nanocrystallites. AFM images confirmed pillar like growth of crystallites along c-axis. Ru incorporation (1, 3, 5 and 7% at.) made film surface rougher, nevertheless roughness decreased with rise in Ru concentration. Ru incorporation at low concentrations significantly improved PEC response of films.
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