Abstract

Photosensitive rectifying heterostructures were prepared based on single crystals of p-CdSiAs2 doped with group-III impurities by depositing In2O3 layers. It was established that the slope of the long-wave edge of the photosensitivity of the obtained structures decreases as the CdSiAs2 hole concentration increases. Based on polarization investigations of the photocurrent, a conclusion is drawn concerning the possibilities for practical application of diode structures in polarization photoelectronics.

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