Abstract

Abstract: In this paper, the photoelastic technique and finite element method were employed to investigate the interfacial stresses induced by thermal loading in bimaterial structures. By observing the photoelastic fringe patterns, in comparison with those theories developed by other investigators, severe temperature and stress gradients were found across the specimens’ heights. The maximum fringe order near the interface was six times that near the top surface of the photoelastic material when the temperature was raised to 65 °C. Furthermore, for the bimaterial structures, differences were found between measured stress fields as a result of increasing and decreasing temperature differences.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.