Abstract
Degradation of organic light-emitting devices (OLEDs) upon ultraviolet (UV) irradiation has been studied by measuring luminance–voltage (L–V) and current–voltage (I–V) characteristics of the devices in a nitrogen-filled glove-box. Photo-oxidation or reaction is no longer the main origin of the degradation for the devices protected by nitrogen. Conventional double-layer OLEDs with tris(8-hydroxyquinoline) aluminum (Alq 3) as the electron transport material and single-layer devices containing Alq 3 as the only organic material exhibit different degradation behaviors: both L–V and I–V characteristics degrade severely for the irradiated double-layer devices, whereas whether I–V degrades or not in a single-layer device is closely related to the species of the charge carriers flowing in the device. By comparing electroluminescent and photoluminescent degradation behaviors of the single-Alq 3-layer devices, we conclude that lowered fluorescent quantum efficiency and hole current after UV irradiation are two origins of the degraded characteristics of the devices isolated from the moist environment.
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