Abstract
A photoconductive frequency-resolved spectrometer (PCFRS) for the determination of carrier lifetime in semiconductors is described. This PCFRS is designed for operation from 1 up to 1000 Hz (lifetime of 0.159 s–0.159 ms). The PCFRS uses an inexpensive superbright light emitting diode, which can be modulated directly, and a system embedded with a 68HC11 microcontroller, which performs all functions of this spectrometer. A sample of the lifetime distribution for a commercial CdS photoresistor is also presented.
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