Abstract

An unexpected high sensitivity to radiation has recently been discovered in a new generation of ultralow loss pure‐silica core optical fiber, the Corning Vascade EX1000. It is investigated how the injected power level of the probing signal at 1310 and 1550 nm affects the radiation‐induced attenuation (RIA) during and after steady‐state X‐ray exposure up to a total ionizing dose (TID) of 250 kGy (SiO2) at room temperature. The experiments confirm this fiber's high sensitivity to radiations, mainly due to the generation of metastable defects absorbing in the infrared domain. RIA kinetics are characterized by a non‐monotonic behavior, reaching a maximum of the radiation‐induced losses at 3.3 kGy (SiO2). Through successive radiation tests, the RIA dependence on the signal power level at the dose corresponding to the maximum of the RIA is studied, finding out that, for the two investigated wavelengths, the RIA follows a power law dependence in the 100 nW–1 mW injected power range, whose exponent seems independent on the dose rate (between 1 and 6 Gy s−1). The results highlight a clear photobleaching phenomenon, with the RIA associated to these metastable defects strongly reduced at higher injected powers of mW levels.

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