Abstract

Graphene is known to show a significant photo-thermoelectric effect that can exceed its photovoltaic contribution. Here, by utilizing this effect, we demonstrate a photovoltage measurement of cyclotron resonance in a double-back-gated h-BN/graphene/h-BN two-terminal device. A graphite local bottom gate was fabricated in addition to a p-doped Si global back gate. By tuning the two gate voltages, an in-plane graphene junction having an asymmetric carrier-doping profile was created. With the help of this asymmetric structure, the photo-thermoelectric voltage generated in the vicinity of the metal-electrode/graphene junction was detected. At a low temperature and in the presence of a magnetic field, a photo-induced voltage was measured under the irradiation of an infrared laser (λ = 9.28–10.61 μm). We observed a strong enhancement of the photovoltage signal under the cyclotron resonance condition, at which the energy of excitation coincides with a transition between Landau levels. These results highlight the possibility of using the photo-thermoelectric effect in graphene for THz photo-detection.

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