Abstract
We have measured the effect of 445 nm, high power diode laser, directed on the cathode of a SNICS ion source on the extracted beam currents of Cl-, Br- and I- ion beams. Beam current enhancement factors up to 9 were observed in Cs-depleted operation mode of the ion source. The photo-assisted enhancement is shown to scale with the laser power and depend strongly on the neutral Cs flux into the ion source. The effect of the laser diminishes with increasing Cs oven temperature. We present a qualitative model, supported by cathode current measurement, arguing that photoelectron emission and Cs coverage of the cathode surface could explain the observations.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
