Abstract
Nonequilibrium quasiparticles represent a significant source of decoherence in superconducting quantum circuits. Here we investigate the mechanism of quasiparticle poisoning in devices subjected to local quasiparticle injection. We find that quasiparticle poisoning is dominated by the propagation of pair-breaking phonons across the chip. We characterize the energy dependence of the timescale for quasiparticle poisoning. Finally, we observe that incorporation of extensive normal metal quasiparticle traps leads to a more than order of magnitude reduction in quasiparticle loss for a given injected quasiparticle power.
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