Abstract
From mobility fluctuation 1 ƒ noise parameter measurements five phononic energies corresponding to LO, TO vibrational modes as well as TA + S 2 or O, TO + TA, TO + O combined modes were identified. They stand for phonon replicas of non-radiative recombination processes. It is thus demonstrated that the carrier-phonon interaction is the source of 1 ƒ noise in semiconductors.
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