Phase-shift, refraction and focusing based on the metamaterial technologies

Abstract

Abstract We address the problem of positive phase-shifting, negative refraction and focusing via a flat lens on the basis of the metamaterial technologies. With this aim, three examples are considered which differ by the technology employed and the operating frequency. The first one concerns negative-zero-positive refraction by using a prism-shaped electromagnetic metamaterial which consists of omega-type inclusion arrays operating at microwaves. The experimental verification was done in this case by angle-resolved transmission measurements. Second, we report on the phase-shift properties of a negative index transmission line which operates at Terahertz frequencies. In order to experimentally demonstrate the left-handed character of the propagation along the line, resulting in a phase advance, we used time domain experiments. At last, focusing by double refraction in a flat negative index lens was demonstrated by the theoretical and experimental mapping of the intensity of the electric field. Such a mapping of the E-field was carried out at near infrared (∼1.5 μm) by analysis in the time domain and scanning by near field optical microscopy. To cite this article: D. Lippens, C. R. Physique 10 (2009).