Phase‐field simulation of piezoresponse force microscopy in consideration of different environmental conditions

Abstract

AbstractPiezoresponse force microscopy (PFM) is a feasible tool which is widely used for investigating information of the domain structures of ferroelectrics. Nevertheless, one drawback of the technique may be that environmental conditions could effect the very small signal which is detected from the displacement of the tip. The present contribution addresses the simulation of PFM in consideration of environmental conditions. We employ a continuum‐mechanical model based on the phase‐field method which accounts for the transversely isotropic symmetry of the underlying material. The goal of this contribution is to analyze the environmental effect on the tip‐sample interaction. (© 2014 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)