Abstract
High-pressure behavior of tetramethylsilane is investigated by synchrotron powder X-ray diffraction and Raman scattering at pressures up to 30 GPa and room temperature. Our results reveal the analogous phase transitions, though slight hysteresis for the certain phases. A new phase is found to appear at 4.2 GPa due to the disappeared Raman mode. These findings offer the possibility to understand the evolution of the H-H bonding with pressure in such hydrogen-rich compounds.
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