Abstract
An uneven distribution of stress in the thickness direction was introduced into Landau theory to investigate the critical behavior of phase transition of ferroelectric thin films. The Curie temperature T C was calculated to increase and decrease for compressive and tensile stress cases, respectively. The dispersion of phase transition was predicted. The diffusivity increased with stress, but showed a non-monotonic relation to film thickness. The results of the calculations were compared with some experimental results.
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