Abstract

Ultra-nanocrystalline diamond films were prepared by a microwave plasma-enhanced chemical vapor deposition reactor using CH4/H2 gas mixture with a power as low as 650 W. The effects of CH4 concentration on nanostructure of the films and gas-phase species in plasma were investigated. The CH4 concentrations of 1.5%, 3.0%, 3.5%, and 4.0% were used and balanced with H2 to a total flow rate of 200 sccm. Morphology and composition of the films were characterized by SEM, Raman spectroscopy and Auger spectroscopy. The gas-phase species and electron density in the plasma were explored by optical emission spectroscopy and plasma-impedance measurement. The increasing CH4 concentration from 1.5% to 4.0% increased C2Hx species and decreased electron density. Phase of the film transform from nano- into ultranano- diamond phase but the growth rate revealingly decreased from 300 to 210 nm/h. Raman spectra indicate the higher CH4 concentration promted phase of the film transiton from NCD to UNCD. While Auger spectra revealed that UNCD film deposited with 4.0%CH4 was composed of 90.52% diamond phase but only 9.48% of graphite phase. The relation between phase transformation of the films and growth mechnism controlled by gas-phase species in the plasma will be dissused.

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