Abstract

A powder X-ray diffraction (XRD) method to enhance the signal of a specific crystalline phase within a mixture is presented for the first time. Specificity to the targeted phase relies on finding coincidences in the ratios of crystal d spacings and the ratios of elemental characteristic X-ray energies. Such coincidences can be exploited so that the two crystal planes diffract through the same scattering angle at two different X-ray energies. An energy-resolving detector placed at the appropriate scattering angle will detect a significantly enhanced signal at these energies if the target mineral or phase is present in the sample. When implemented using high scattering angles, for example 2θ > 150°, the method is tolerant to sample morphology and distance on the scale of ∼2 mm. The principle of the method is demonstrated experimentally using Pd Lα1 and Pd Lβ1 emission lines to enhance the diffraction signal of quartz. Both a pure quartz powder pellet and an unprepared mudstone rock specimen are used to test and develop the phase-targeted method. The technique is further demonstrated in the sensitive detection of retained austenite in steel samples using a combination of In Lβ1 and Ti Kβ emission lines. For both these examples it is also shown how the use of an attenuating foil, with an absorption edge close to and above the higher-energy characteristic X-ray line, can serve to isolate to some degree the coincidence signals from other fluorescence and diffraction peaks in the detected spectrum. The phase-targeted XRD technique is suitable for implementation using low-cost off-the-shelf components in a handheld or in-line instrument format.

Highlights

  • For many applications in research and commerce, X-ray diffraction (XRD) represents the gold-standard materials analysis technique because of the uniqueness of the diffraction pattern of each distinct microcrystalline phase, based on the set of d spacings that are specific to each crystal structure

  • The phase-targeted XRD technique described in this paper identifies microcrystalline phases via the uniqueness of their d spacings

  • Whether the detection of two or more d spacings present in a sample translates into phase specificity depends on a number of factors, including the accuracy of the exploited coincidence of d-spacing and characteristic energy ratios, and the angular resolution afforded by the experimental configuration

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Summary

Introduction

For many applications in research and commerce, X-ray diffraction (XRD) represents the gold-standard materials analysis technique because of the uniqueness of the diffraction pattern of each distinct microcrystalline phase, based on the set of d spacings that are specific to each crystal structure. A handful of portable XRD instruments that can be taken to the sample and applied nondestructively have been developed, mainly for archaeometry research (Uda, 2004; Uda et al, 2005; Cuevas & Gravie, 2011). Only one field-portable instrument is available commercially (Sarrazin et al, 2008; Chipera et al, 2009), mainly intended for geological and mining applications.

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