Abstract
Light wave reflection intensity from optical disordered media is associated with its phase, and the phase statistics influence the reflection statistics. A detailed numerical study is reported for the statistics of the reflection coefficient |R(L)|2 and its associated phase θ for plane electromagnetic waves reflected from one dimensional Gaussian white-noise optical disordered media, ranging from weak to strong disordered regimes. The full Fokker–Planck (FP) equation for the joint probability distribution in the |R(L)|2−(θ) space is simulated numerically for varying length and disorder strength of the sample; and the statistical optical transport properties are calculated. Results show the parameter regimes of the validation of the random phase approximations (RPA) or uniform phase distribution, within the Born approximation, as well as the contribution of the phase statistics to the different reflections, averaging from nonuniform phase distribution. This constitutes a complete solution for the reflection phase statistics and its effect on light transport properties in a 1D Gaussian white-noise disordered optical potential.
Highlights
Wave propagation through 1D disordered media has been a subject of study for both optical and electrical systems
Most of the transport reported results are within the random phase approximations (RPA)
Disordered 1D systems are quite generic as regards their transport properties which are well addressed first in electronic systems—disordered 1D conductors are all alike, but every ordered 1D conductor is ordered in its own way
Summary
Wave propagation through 1D disordered media has been a subject of study for both optical and electrical systems. It is shown that the root meansquare-fluctuation is more than the average for length scales larger than the scattering mean free path (i.e., localization length), while for the length scales within the mean free path (i.e., in the good metallic regime for quasi 1D and higher dimensional systems) the fluctuations are finite and universal, the so-called universal conductance fluctuations (UCF) [7]. These fluctuations make the resistance and the conductance non-self-averaging quantities for electronic systems.
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