Abstract
Structural stabilities in thin-film Al/Ti multilayers have been studied using transmission electron microscopy. It is shown that models based on interface-induced modifications to bulk stacking fault energies, and/or coherency-strain energy may not be used to explain the various phase transitions observed. Rather, phase stability may be rationalized by reference to a new model based on classical thermodynamics, involving the competition between bulk and interfacial energies. Thus, these phase transitions are shown to be driven by reductions in the overall interfacial energies. A biphase diagram (reciprocal of bilayer thickness vs composition) has been developed for the multilayers produced by magnetron sputtering. The influence of impurities possibly introduced during thin-foil preparation is considered and rationalized by reference to the biphase diagram for this system.
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