Abstract
The addition of Ag to Cu-Ga-In precursors for reaction to form (AgCu)(InGa)Se2 has shown benefits including improved adhesion, greater process tolerance and potential for improved device performance. In this study, metal precursors were sputtered with a Cu-Ga/In/Ag-Ga sequence with Ag/(Cu+Ag) = 0.25 and (Ag+Cu)/(Ga+In) = 0.90. These precursor layers are shown to be unstable, with a phase evolution during storage at room temperature revealed by x-ray diffraction (XRD). This behavior was studied in samples annealed in the temperature range of 60–150°C or stored for up to 90 days. XRD analyses indicated the formation of (Ag1−xCux)In2 with Cu content of 28% and 36% for samples annealed at 100°C and 150°C, respectively. Energy dispersive x-ray spectroscopy and XRD analyses on selenized samples showed a uniform distribution of Ag and Cu through the films and a Ga accumulation near the back interface. Solar cells fabricated from the selenized films showed improved device performance in VOC and FF as a result of the precursor anneal.
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