Abstract
A novel phase-shifts n pi/2 calibration method for phase-stepping interferometry, in which the sum intensities and the squared sum of a series of phase-shifted interferograms are firstly calculated, and then by the minimization of the variances of these sums perform the n pi/2 phase-shifts calibration, is proposed in this paper. The proposed method can overcome effectively the effect of the variations of background and modulation intensities in interferograms with any phase structure, and it is also insensitive to the nonlinearity of phase shifter. Numerical simulation and experiments are implemented to verify the effectiveness of this method.
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