Abstract
Optical vortex interferometer (OVI) is a useful tool to generate a regular lattice of optical vortices. The lattice is generated by the interference of the three plane waves. As was shown in earlier papers such a vortex lattice can be practically used in metrology. Application of optical vortex interferometer in metrology depends on the precision of the vortex points localization. In this paper we present a novel localization method, which uses the phase shifting technique applied to the additional fourth wave. Phase shift of the fourth wave doesn't change intensity in vortex points and increases intensity gradient in their vicinity. The applicability of this method was verified in the experiment.
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