Abstract
Control of the domain size and morphology of ferroelectric-semiconductor polymer blend thin films is essential for producing working organic ferroelectric resistive switches that can be used for low-cost, flexible memory applications. However, improvements in characterization techniques that can selectively probe these polymers are still needed. The unique core-level absorption profiles of these polymers make synchrotron based soft X-ray techniques ideal to achieve contrast and chemical sensitivity between polymers and characterize thin film morphology. Transmission soft X-ray microscopy and scattering reveal that a phase separated structure exists through the bulk for a blend of a semicrystalline semiconducting polythiophene with a functionalized side chain and a well-studied ferroelectric polymer. Surface sensitive soft X-ray spectroscopy and wide-angle X-ray scattering suggest a potential enhancement of polythiophene at the film surface, and that the surface layer is more amorphous in character. This w...
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
