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Abstract
We present a novel measurement technique to perform full phase-sensitive tomography on the joint spectrum of photon pair sources, using stimulated four-wave mixing and phase-sensitive amplification. Applying this method to an integrated silicon nanowire source with a frequency chirped pump laser, we are able to observe a corresponding phase change in the spectral amplitude that would otherwise be hidden in standard intensity measurements. With a highly nonlinear fiber source, we show that phase-sensitive measurements have superior sensitivity to small spectral features when compared to intensity measurements. This technique enables more complete characterization of photon pair sources based on nonlinear photonics.
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