Phase retrieval from a single near-field diffraction pattern with a large Fresnel number

Abstract

A new method of phase retrieval from a single near-field diffraction image with a large Fresnel number is presented and discussed. This method requires only the oversampled diffraction pattern without any other information such as the object envelope. Moreover, we show that the combination with a fast computational method is possible when the linear oversampling ratio is an integer. Numerical simulations are also presented, showing that the method works well with noisy data.