Abstract
The market value for the plastics manufacturing industry is projected to exceed USd700 billion in the coming decade [1]. Technology for reliable quality control is an essential component of the manufacturing process. Present technology for monitoring the thickness profile of manufactured plastics typically makes use of interferometry with a white-light (broadband or tunable-wavelength) laser source. [2]-[5]. While this method has found satisfactory implementation as a quality control mechanism to monitor deviations in the thickness of plastics, the cost and complexity of implementation can be prohibitive. In addition, laser-based time-of-flight terahertz time-domain spectroscopic (THz-TDS) tomography systems have been presented as a suitable alternative; however, a femtosecond pulsed laser is still required to render measurements on the order of a micron (mm) [6].
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