Abstract
We present phase-noise measurements in support of terahertz electronics. By combining even-harmonic mixers with a 2.5 GHz frequency comb, we achieve a phase-noise measurement system in waveguide (WR1.5) by use of cross-spectral and digital phase-noise measurement techniques. At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
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