Abstract
Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb2/3)O3 (PZN)–0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200°C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN–0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN–0.1PT is a more favorable medium for the fabrication of optical memories.
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