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Abstract
Dislocation dynamics near a free surface and in heteroepitaxial thin films are simulated using an extended version of the nanoscale Phase Field Microelasticity model of dislocations [Acta Mater. 49 (2001) 1847]. The model automatically takes into account the effect of image forces on dislocation motions. In particular, the operations of Frank–Read sources in epitaxial films grown on infinitely thick and relatively thin substrates are investigated. The simulation reveals different misfit dislocation behaviors at the interface. Its implication on the interface susceptibility to crack nucleation is discussed.
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